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The delay fault testing and transition fault models are two of the most challenging components of microelectronic designs. Delay faults occur when the electronic signals are not timely delivered to the desired locations due to faulty delay paths or delay loops in the circuit design. These faults, if not corrected, can lead to errors, delays, and overall failures in the device function. Transition faults arise when there is a change in the electrical characteristics of the circuit due to various reasons. It could be due to switching, switching current, or capacitor charging,